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Features
■ Resistance value as low as 0.001 ohm
■ High power density
Applications
■ Power supplies
■ Stepper motor drives
■ Inductance less than 5 nH
■ RoHS compliant*
CRF Series - High Power Current Sense Chip Resistor
Electrical Characteristics
Rating
Power Rating @ 70 °C
Operating Temperature Range
Derated to Zero Load at
Maximum Working Voltage
Resistance
Resistance Tolerance
CRF0805
0.5 W
0.005 ~ 0.020 Ω
CRF1206
1W
-55 °C to +170 °C
+170 °C
(P x R) 1/2
0.001 ~ 0.030 Ω
1 %, ±5 %
(0.001 Ω)
CRF2512
(0.001 to 0.010 Ω) 2 W
(0.011 to 0.050 Ω) 1 W
0.001 ~ 0.050 Ω
±275 PPM/°C
Temperature Coef?cient
Performance Characteristics
±100 PPM/°C
(0.002 to 0.010 Ω) ±100 PPM/°C
(>0.010 Ω)
± 75 PPM/°C
Test
Conditions
CRF0805
Speci?cation
CRF1206
CRF2512
Thermal Shock
Short Time Overload
Low Temperature Storage
High Temperature Exposure
Bias Humidity
Mechanical Shock
-55 ?C to +150 ?C,
300 Cycles, 15 minutes
5 X Rated Power for 5 seconds
-55 ?C for 1000 hours
1000 hours @ + 170 ?C
+ 85 ?C, 85 % RH,
10 % Bias, 1000 hours
100 g for 6 milliseconds,
5 pulses
Δ R ±(1 % + 0.0005 Ω )
Δ R ±(0.5 % + 0.0005 Ω )
Δ R ±(0.5 % + 0.0005 Ω )
Δ R ±(1 % + 0.0005 Ω )
N/A
N/A
Δ R ±(0.5 % + 0.0005 Ω )
Δ R ±(0.5 % + 0.0005 Ω )
Δ R ±(0.5 % + 0.0005 Ω )
Δ R ±(0.5 % + 0.0005 Ω )
Δ R ±(1 % + 0.0005 Ω )
Δ R ±(0.5 % + 0.0005 Ω )
Frequency varied 10-2000 KHz
Vibration
in one minute, 3 directions,
12 hours
N/A
Δ R ±(0.5 % + 0.0005 Ω )
1000 hours at rated power at
Load Life
+70 ?C, 1.5 hours on, 0.5 hours
Δ R ±(1 % + 0.0005 Ω )
Δ R ±(1 % + 0.0005 Ω )
off
Resistance to Solder Heat
Moisture Resistance
+260 ?C, 10-12 second dwell,
25 mm/second emergence
MIL-STD-202 Method 106, 0 %
power (7a and 7b not required)
Δ R ±(0.5 % + 0.0005 Ω )
Δ R ±(1 % + 0.0005 Ω )
Δ R ±(0.5 % + 0.0005 Ω )
Δ R ±(0.5 % + 0.0005 Ω )
*RoHS Directive 2002/95/EC Jan. 27, 2003 including annex and RoHS Recast 2011/65/EU June 8, 2011.
Speci?cations are subject to change without notice.
The device characteristics and parameters in this data sheet can and do vary in different applications and actual device performance may vary over time.
Users should verify actual device performance in their speci?c applications.
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